Practical Electron Microscopy Of Lattice Defects

Hiroyasu Saka (Nagoya Univ, Japan & Aichi Inst Of Technology, Japan)

Practical Electron Microscopy Of Lattice Defects
Format
Hardback
Publisher
World Scientific Publishing Co Pte Ltd
Country
Singapore
Published
26 April 2021
Pages
308
ISBN
9789811234699

Practical Electron Microscopy Of Lattice Defects

Hiroyasu Saka (Nagoya Univ, Japan & Aichi Inst Of Technology, Japan)

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‘Although the study of such defects is regularly examined at length in more general books on electron microscopy, this text in which they are centre-stage will surely be appreciated.’ [Read Full Review]UltramicroscopyThis unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.

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