Test and Measurement: Know It All, Jon S. Wilson (Principal Consultant, The Dynamic Consultant, CA, USA),Stuart Ball (Embedded Systems consultant and author),Creed Huddleston (Real-Time by Design, LLC, Raleigh, NC, USA),Edward Ramsden (Senior Engineer, Lattice Semiconductor, Hillsboro, OR, USA),Dogan Ibrahim (Traffic Control Systems Unit, South Bank University, UK, and lecturer at the Department of Computer Information Systems, Near East University, Lefkosa, Cyprus) (9781856175302) — Readings Books

Become a Readings Member to make your shopping experience even easier. Sign in or sign up for free!

Become a Readings Member. Sign in or sign up for free!

Hello Readings Member! Go to the member centre to view your orders, change your details, or view your lists, or sign out.

Hello Readings Member! Go to the member centre or sign out.

In Victoria? Order in-stock items by Sunday 14 December to get your gifts by Christmas! Or find the deadline for your state here.

Cart ⚙️
Home / Test and Measurement: Know It All
Test and Measurement: Know It All
Paperback

Test and Measurement: Know It All

Jon S. Wilson (Principal Consultant, The Dynamic Consultant, CA, USA),Stuart Ball (Embedded Systems consultant and author),Creed Huddleston (Real-Time by Design, LLC, Raleigh, NC, USA),Edward Ramsden (Senior Engineer, Lattice Semiconductor, Hillsboro, OR, USA),Dogan Ibrahim (Traffic Control Systems Unit, South Bank University, UK, and lecturer at the Department of Computer Information Systems, Near East University, Lefkosa, Cyprus)
$113.95
Add to wishlist
Sign in or become a Readings Member to add this title to your wishlist.

7 ½ X 9 ¼ in Chapter 1 Fundamental of measurement 1.1 Introduction 1.2 Fundamental concepts Bibliography

Chapter 2 Sensors and Transducers 2.1 Basic S ensor Technology 2.2 Sensor Systems 2.3 Applic ation Considerations 2.4 Sensor Characteristics 2.5 System Characteristics 2.6 Instrument Selection 2.7 Data Acquisition and Readout 2.8 Installation2.9 Measurement Issues and Criteria

Chapter 3. Data acquisition hardware and software 3.1 AD Cs 3.2 Types of ADCs 3.3 ADC Comparison 3.4 Sample and Hold 3.5 Real Parts 3.6 Microprocessor Interfacing 3.7 Clocked Interfaces 3.8 Serial Interfaces 3.9 Multichannel ADCs 3.10 Internal Microcontroller ADCs 3.11 Codecs 3.12 Interrupt Rates 3.13 Dual-Function Pins on Microcon trollers 3.14 Design Checklist

C

Read More
In Shop
Out of stock
Shipping & Delivery

$9.00 standard shipping within Australia
FREE standard shipping within Australia for orders over $100.00
Express & International shipping calculated at checkout

MORE INFO

Stock availability can be subject to change without notice. We recommend calling the shop or contacting our online team to check availability of low stock items. Please see our Shopping Online page for more details.

Format
Paperback
Publisher
Elsevier Science & Technology
Country
United Kingdom
Date
4 November 2008
Pages
912
ISBN
9781856175302

7 ½ X 9 ¼ in Chapter 1 Fundamental of measurement 1.1 Introduction 1.2 Fundamental concepts Bibliography

Chapter 2 Sensors and Transducers 2.1 Basic S ensor Technology 2.2 Sensor Systems 2.3 Applic ation Considerations 2.4 Sensor Characteristics 2.5 System Characteristics 2.6 Instrument Selection 2.7 Data Acquisition and Readout 2.8 Installation2.9 Measurement Issues and Criteria

Chapter 3. Data acquisition hardware and software 3.1 AD Cs 3.2 Types of ADCs 3.3 ADC Comparison 3.4 Sample and Hold 3.5 Real Parts 3.6 Microprocessor Interfacing 3.7 Clocked Interfaces 3.8 Serial Interfaces 3.9 Multichannel ADCs 3.10 Internal Microcontroller ADCs 3.11 Codecs 3.12 Interrupt Rates 3.13 Dual-Function Pins on Microcon trollers 3.14 Design Checklist

C

Read More
Format
Paperback
Publisher
Elsevier Science & Technology
Country
United Kingdom
Date
4 November 2008
Pages
912
ISBN
9781856175302

Looking for something in particular?

Search our extensive online catalogue.