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Scanning Probe Microscopy
Hardback

Scanning Probe Microscopy

$223.99
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This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.

Scanning Probe Microscopy (SPM) involves forming images of surfaces using a physical scanning and detection method. The key subject of this text, scanning probe microscopy is a major tool for the progress of nanotechnology with functions in a multitude of study spheres. This book comprises of unique studies on the uses of SPM methods for the classification of physical attributes of various materials at the nano level. The various topics covered in this book vary from morphology of surfaces to analyzing thin films. The diversity of topics covered in this book reflects the prominent interdisciplinary trait of the study in the sphere of scanning probe microscopy.

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MORE INFO
Format
Hardback
Publisher
NY Research Press
Date
12 January 2015
Pages
256
ISBN
9781632384072

This title is printed to order. This book may have been self-published. If so, we cannot guarantee the quality of the content. In the main most books will have gone through the editing process however some may not. We therefore suggest that you be aware of this before ordering this book. If in doubt check either the author or publisher’s details as we are unable to accept any returns unless they are faulty. Please contact us if you have any questions.

Scanning Probe Microscopy (SPM) involves forming images of surfaces using a physical scanning and detection method. The key subject of this text, scanning probe microscopy is a major tool for the progress of nanotechnology with functions in a multitude of study spheres. This book comprises of unique studies on the uses of SPM methods for the classification of physical attributes of various materials at the nano level. The various topics covered in this book vary from morphology of surfaces to analyzing thin films. The diversity of topics covered in this book reflects the prominent interdisciplinary trait of the study in the sphere of scanning probe microscopy.

Read More
Format
Hardback
Publisher
NY Research Press
Date
12 January 2015
Pages
256
ISBN
9781632384072