Proposed Mathematical Model for Predicting Military Electronic Equipment Component Failure Rates and Isolating Underlying Failure Causes

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A mathematical expression for combining the entire failure rate curve is derived based on the assumption that the failure population is composed of three subpopulations, early, chance, and wear out. A graphical method is provided for separating the subpopulations and determining the parameters of the model. The expression is then applied to observed failure data in three detailed examples and in each case the model is shown to represent the observed data at the.05 significance level using the Kolmogorov-Smirnov Test. Two BASIC language computer programs are provided to simplify the use of the proposed model.