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Explore the history of intelligence testing with "Condensed Guide for the Stanford Revision of the Binet-Simon Intelligence Tests" by Lewis Madison Terman. This meticulously prepared print edition offers a concise overview of the landmark Stanford revision of the Binet-Simon test, a cornerstone of IQ testing and psychometrics. Delve into the foundational principles behind the assessment of intelligence, as developed and refined in the early 20th century.
This guide provides invaluable insights into the development and application of the Binet-Simon test, a crucial tool in educational psychology and social work. Discover the methods and rationale behind this pioneering intelligence scale, which played a significant role in shaping our understanding of human cognitive abilities. Whether you are interested in the history of psychology, the evolution of IQ testing, or the foundations of educational assessment, this volume offers a unique and informative glimpse into a pivotal moment in the field.
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