Development of Methods for Characterisation of Roughness in Three Dimensions

Ken J Stout,Liam Blunt (Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK),W. P. Dong,E. Mainsah,N. Luo

Development of Methods for Characterisation of Roughness in Three Dimensions
Format
Paperback
Publisher
Elsevier Science & Technology
Country
United Kingdom
Published
1 June 2002
Pages
384
ISBN
9781857180237

Development of Methods for Characterisation of Roughness in Three Dimensions

Ken J Stout,Liam Blunt (Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK),W. P. Dong,E. Mainsah,N. Luo

Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard.

This item is not currently in-stock. It can be ordered online and is expected to ship in approx 2 weeks

Our stock data is updated periodically, and availability may change throughout the day for in-demand items. Please call the relevant shop for the most current stock information. Prices are subject to change without notice.

Sign in or become a Readings Member to add this title to a wishlist.